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One Year
One Year
Contour
N/a
Probe Contact
0-100mm
| Quantity: | |
|---|---|
| project | parameter | ||
| measuring range | X-axis drive | 100mm | |
| Z1 (sensor) | 40mm | ||
| Column itinerary | 500mm | ||
| Indicate accuracy | X axis (L=X-axis moving rail distance) | ±(1.2+0.02L)μm | |
| X axle (L=X-axis moving rail distance) | ±(1.0+0.05H)μm | ||
| angle | ≤±1.5′ | ||
| arc (R= the standard circular arc value | ≤±(1.2+R/12)μm | ||
| x-axis | straightness | 0.8μm /100mm | |
| resolution | 0.1μm | ||
| sensor | type | grating sensor | |
| resolution | 0.1μm | ||
| Probe shape | 25μm 12° | ||
| Probe material | Hard metal | ||
| Measurement method | Sensor movement | ||
| motor control | Guide rail speed | 0.02mm to 6mm/s | |
| Column movement speed | 0.1mm to 10mm/s | ||
| Measurement speed | 0.02mm to 5.0mm/s | ||
Introducing the Series, a game-changing Roughness Profilometer that marries advanced measurement technology with sleek, user-focused design. Engineered for the discerning professional, this Roughness Tester brings laboratory-grade accuracy to surface roughness analysis, revolutionizing the way industries assess and understand material textures.
The Series harnesses cutting-edge sensor technology to deliver unparalleled Roughness measurement accuracy. Its high-resolution profilometric scanning system captures surface features with micron-level detail, ensuring measurements adhere to international standards such as ISO, ASME, and JIS. Whether measuring Ra, Rz, or other roughness parameters, the XX guarantees reliable results every time.
Usability is central to the design. Its intuitive touchscreen interface simplifies operation, allowing users to navigate menus, set parameters, and analyze results with ease. The instrument's smart features, including automatic calibration and diagnosis, reduce setup time and eliminate guesswork, making it a favorite among laboratory technicians and engineers alike.
Versatility defines the Series. It is adept at analyzing a broad range of surfaces, from the roughest of castings to the smoothest of polished finishes. With a wide measurement range and interchangeable styli to accommodate various surface profiles, this Lab Instrument Profilometer Roughness ensures no surface characteristic goes unnoticed. Its detailed reporting capability further enriches data analysis, supporting in-depth research and quality control processes.
Durability and efficiency are hallmarks of the XX Series. Constructed with premium materials and rigorous testing standards, the instrument is built to withstand the rigors of daily use in industrial and laboratory environments. Its rapid measurement cycles and wireless connectivity options streamline workflow, enabling real-time data sharing and analysis for faster decision-making.
The XX Series isn't just a tool; it's a gateway to the future of surface metrology. Its compatibility with advanced software solutions allows for seamless integration into existing laboratory ecosystems, opening doors to data-driven insights and process optimization. Whether in R&D, manufacturing, or academic research, the XX elevates the standard for precision, efficiency, and user experience in Roughness measurement.
| project | parameter | ||
| measuring range | X-axis drive | 100mm | |
| Z1 (sensor) | 40mm | ||
| Column itinerary | 500mm | ||
| Indicate accuracy | X axis (L=X-axis moving rail distance) | ±(1.2+0.02L)μm | |
| X axle (L=X-axis moving rail distance) | ±(1.0+0.05H)μm | ||
| angle | ≤±1.5′ | ||
| arc (R= the standard circular arc value | ≤±(1.2+R/12)μm | ||
| x-axis | straightness | 0.8μm /100mm | |
| resolution | 0.1μm | ||
| sensor | type | grating sensor | |
| resolution | 0.1μm | ||
| Probe shape | 25μm 12° | ||
| Probe material | Hard metal | ||
| Measurement method | Sensor movement | ||
| motor control | Guide rail speed | 0.02mm to 6mm/s | |
| Column movement speed | 0.1mm to 10mm/s | ||
| Measurement speed | 0.02mm to 5.0mm/s | ||
Introducing the Series, a game-changing Roughness Profilometer that marries advanced measurement technology with sleek, user-focused design. Engineered for the discerning professional, this Roughness Tester brings laboratory-grade accuracy to surface roughness analysis, revolutionizing the way industries assess and understand material textures.
The Series harnesses cutting-edge sensor technology to deliver unparalleled Roughness measurement accuracy. Its high-resolution profilometric scanning system captures surface features with micron-level detail, ensuring measurements adhere to international standards such as ISO, ASME, and JIS. Whether measuring Ra, Rz, or other roughness parameters, the XX guarantees reliable results every time.
Usability is central to the design. Its intuitive touchscreen interface simplifies operation, allowing users to navigate menus, set parameters, and analyze results with ease. The instrument's smart features, including automatic calibration and diagnosis, reduce setup time and eliminate guesswork, making it a favorite among laboratory technicians and engineers alike.
Versatility defines the Series. It is adept at analyzing a broad range of surfaces, from the roughest of castings to the smoothest of polished finishes. With a wide measurement range and interchangeable styli to accommodate various surface profiles, this Lab Instrument Profilometer Roughness ensures no surface characteristic goes unnoticed. Its detailed reporting capability further enriches data analysis, supporting in-depth research and quality control processes.
Durability and efficiency are hallmarks of the XX Series. Constructed with premium materials and rigorous testing standards, the instrument is built to withstand the rigors of daily use in industrial and laboratory environments. Its rapid measurement cycles and wireless connectivity options streamline workflow, enabling real-time data sharing and analysis for faster decision-making.
The XX Series isn't just a tool; it's a gateway to the future of surface metrology. Its compatibility with advanced software solutions allows for seamless integration into existing laboratory ecosystems, opening doors to data-driven insights and process optimization. Whether in R&D, manufacturing, or academic research, the XX elevates the standard for precision, efficiency, and user experience in Roughness measurement.
