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| Item | Parameter | |
Measurement range | Xaxis | 100mm |
| Z1()Sensor | 40mm | |
| Height | 450mm | |
| Min. inner hole | 30mm () | |
Measurement Accuracy | X axis (L=X) (L=X moving distance) | ±(1+0.05L)μm |
| Z1axis (H=Z1) (H=Z1meas. Height) | ±(1+0.02H)μm | |
| Indication error | ±5% | |
| Indicative stability | ≤±7% | |
Repeatability measurement | ±3% | |
Roughness residual error | ≤0.005μm | |
| X X axis | Straightness | 0.6μm /100mm |
| Resolution | 0.01μm | |
Sensor | Type | Digital grating sensor |
| Resolution | 0.01μm | |
| Assessment length | λc×2,3,4,5,6,7 | |
| Cut-off wavelength | 0.025,0.08,0.25,0.8,2.5,8mm | |
| Climbing Ability | 77°(Upside), 88°(Downside) | |
| Measuring Speed | 0.02mm to 4.0mm/s | |
| Measuring Mode | Sensor moving | |
| Power | AC 220V±10%, 50Hz | |
| Environmental conditions | (T):10~30ºC;(RH):<85% | |
Part Name | project name | |
Mechanical Part | Host instrument stand: 1 | |
| Granite table: 1 | ||
| Up-right Column : 1 | ||
| Digital Sensor: 1 | ||
Adjustment Table | Horizontal adjustment device: 1 | |
| Rotation adjustment device: 1 | ||
| Fixture: 1 | ||
| Calibration Gauge : 1 set | ||
Stylus and Probe | Φ3*21mm R0.025mm :2 Φ3*21mm with R0.025mm slope tip: 2 pcs | |
| Φ3*20mm R5μm :1 Φ3*20mm with R5μm Needle probe: 1pcs | ||
| Φ8*150mm 1, Φ8*150mm Probe: 1 pc | ||
Electrical Part | Electrical control system:1 | |
| (Computer)1 | ||
| HP(HP Inkjet Printer)1 | ||
| (Software):1 | ||
Introduction to Precision at its Finest
In an era where accuracy and precision are paramount in scientific research and industrial quality control, the High Precision Laboratory Profilometer Machine Contour Tester emerges as the pinnacle of surface measurement technology. Engineered to redefine the standards of profilometry, this state-of-the-art instrument guarantees unparalleled insights into surface topography, texture, and contour with a level of detail that was once unimaginable.
At the core of our High Precision Profilometer Machine lies a sophisticated system designed to measure surface profiles with micrometer-level accuracy. The term 'profliterole' inadvertently used seems to be a typographical error; the correct focus is on 'profilometer,' which refers to this advanced equipment's capability to map surface features through contact or non-contact methods. Utilizing laser interferometry or high-resolution scanning techniques, it ensures measurements are not just precise but also repeatable, making it a cornerstone in laboratories demanding the utmost in measurement integrity.
The Contour Tester component within our machine excels in analyzing complex three-dimensional surfaces with intricate contours. It meticulously traces every ridge and valley, translating them into comprehensive digital models. This feature is invaluable for industries such as aerospace, semiconductor manufacturing, and medical device development, where minuscule deviations can significantly impact performance and safety. By providing in-depth contour analysis, our instrument fosters innovation by enabling engineers to optimize designs based on real-world data.
Our Laboratory Profilometer isn't confined to a singular application. Its versatility spans across a myriad of sectors, from materials science to microelectronics, offering tailored solutions for R&D and quality assurance processes. With customizable measurement parameters and an intuitive user interface, it simplifies even the most intricate testing procedures, empowering researchers and technicians alike to extract meaningful insights from their samples.
| Item | Parameter | |
Measurement range | Xaxis | 100mm |
| Z1()Sensor | 40mm | |
| Height | 450mm | |
| Min. inner hole | 30mm () | |
Measurement Accuracy | X axis (L=X) (L=X moving distance) | ±(1+0.05L)μm |
| Z1axis (H=Z1) (H=Z1meas. Height) | ±(1+0.02H)μm | |
| Indication error | ±5% | |
| Indicative stability | ≤±7% | |
Repeatability measurement | ±3% | |
Roughness residual error | ≤0.005μm | |
| X X axis | Straightness | 0.6μm /100mm |
| Resolution | 0.01μm | |
Sensor | Type | Digital grating sensor |
| Resolution | 0.01μm | |
| Assessment length | λc×2,3,4,5,6,7 | |
| Cut-off wavelength | 0.025,0.08,0.25,0.8,2.5,8mm | |
| Climbing Ability | 77°(Upside), 88°(Downside) | |
| Measuring Speed | 0.02mm to 4.0mm/s | |
| Measuring Mode | Sensor moving | |
| Power | AC 220V±10%, 50Hz | |
| Environmental conditions | (T):10~30ºC;(RH):<85% | |
Part Name | project name | |
Mechanical Part | Host instrument stand: 1 | |
| Granite table: 1 | ||
| Up-right Column : 1 | ||
| Digital Sensor: 1 | ||
Adjustment Table | Horizontal adjustment device: 1 | |
| Rotation adjustment device: 1 | ||
| Fixture: 1 | ||
| Calibration Gauge : 1 set | ||
Stylus and Probe | Φ3*21mm R0.025mm :2 Φ3*21mm with R0.025mm slope tip: 2 pcs | |
| Φ3*20mm R5μm :1 Φ3*20mm with R5μm Needle probe: 1pcs | ||
| Φ8*150mm 1, Φ8*150mm Probe: 1 pc | ||
Electrical Part | Electrical control system:1 | |
| (Computer)1 | ||
| HP(HP Inkjet Printer)1 | ||
| (Software):1 | ||
Introduction to Precision at its Finest
In an era where accuracy and precision are paramount in scientific research and industrial quality control, the High Precision Laboratory Profilometer Machine Contour Tester emerges as the pinnacle of surface measurement technology. Engineered to redefine the standards of profilometry, this state-of-the-art instrument guarantees unparalleled insights into surface topography, texture, and contour with a level of detail that was once unimaginable.
At the core of our High Precision Profilometer Machine lies a sophisticated system designed to measure surface profiles with micrometer-level accuracy. The term 'profliterole' inadvertently used seems to be a typographical error; the correct focus is on 'profilometer,' which refers to this advanced equipment's capability to map surface features through contact or non-contact methods. Utilizing laser interferometry or high-resolution scanning techniques, it ensures measurements are not just precise but also repeatable, making it a cornerstone in laboratories demanding the utmost in measurement integrity.
The Contour Tester component within our machine excels in analyzing complex three-dimensional surfaces with intricate contours. It meticulously traces every ridge and valley, translating them into comprehensive digital models. This feature is invaluable for industries such as aerospace, semiconductor manufacturing, and medical device development, where minuscule deviations can significantly impact performance and safety. By providing in-depth contour analysis, our instrument fosters innovation by enabling engineers to optimize designs based on real-world data.
Our Laboratory Profilometer isn't confined to a singular application. Its versatility spans across a myriad of sectors, from materials science to microelectronics, offering tailored solutions for R&D and quality assurance processes. With customizable measurement parameters and an intuitive user interface, it simplifies even the most intricate testing procedures, empowering researchers and technicians alike to extract meaningful insights from their samples.
